Crystalline characterization by Rutherford backscattering...

Journal of Materials Science 1993 / 09 Vol. 28; Iss. 18

Crystalline characterization by Rutherford backscattering spectrometry and electron channelling ofin situgrown YBa2Cu3O7thin films deposited on (1 0 0) MgO by d.c. sputtering or laser ablation

M. Kechouane, H. L'Haridon, M. Salvi, P. N. Favennec, M. Gauneau, M. Guilloux-Viry, M. G. Karkut, C. Thivet, A. Perrin
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Volume:
28
Language:
english
Pages:
6
DOI:
10.1007/bf00361158
Date:
September, 1993
File:
PDF, 1.24 MB
english, 1993
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