In situ monitoring and ex situ TEM analyses of spinel...

Journal of Materials Science 2016 / 10 Vol. 51; Iss. 19

In situ monitoring and ex situ TEM analyses of spinel (MgAl\(_2\)O\(_4\)) growth between (111)-oriented periclase (MgO) substrates and Al\(_2\)O\(_3\)thin films

Götze, L. C., Milke, R., Zizak, I., Wirth, R.
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Volume:
51
Language:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-016-0130-2
Date:
October, 2016
File:
PDF, 2.42 MB
english, 2016
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