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Simulation analysis of the influence of leakage resistance on 1–10–100TΩ guarded resistance transfer devices accuracy
Kocjan, Bartłomiej, Krawczyk, Krystian, Lisowski, MichalVolume:
93
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2016.06.057
Date:
November, 2016
File:
PDF, 1.14 MB
english, 2016