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SPIE Proceedings [SPIE Applications in Optical Science and Engineering - Boston, MA (Sunday 15 November 1992)] Industrial Applications of Optical Inspection, Metrology, and Sensing - Electronic speckle pattern interferometry with holo-optical element

Krishna Mohan, Nandigana K., Masalkar, Prafulla J., Sirohi, Rajpal S., Brown, Gordon M., Harding, Kevin G., Stahl, H. Philip
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Volume:
1821
Year:
1993
Language:
english
DOI:
10.1117/12.145541
File:
PDF, 817 KB
english, 1993
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