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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Measurement and evaluation of the damaged layer on a surface ground at ultrathin depth
Xie, Liang-Fu, Zhang, Hong-Hai, Li, Shang-Ping, Zhu, Feng, Chen, Ri-Yao, Huang, Qi-Kui, Zhu, LiVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156291
File:
PDF, 112 KB
english, 1993