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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Ultraviolet Technology V - Proposed UV-laser-source-excited high-resolution and high-count-rate time-of-flight photoelectron energy analyzer for solid state samples
Aleksandrovsky, Aleksander S., Slabko, Vitaly V., Huffman, Robert E., Stergis, Christos G.Volume:
2282
Year:
1994
Language:
english
DOI:
10.1117/12.186603
File:
PDF, 702 KB
english, 1994