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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Mueller matrix formalism in imagery: an experimental arrangement for noise reduction
Le Jeune, Bernard, Marie, Jean-Pierre, Gerligand, Pierre-Yves, Cariou, Jack, Lotrian, Jean, Goldstein, Dennis H., Chenault, David B.Volume:
2265
Year:
1994
Language:
english
DOI:
10.1117/12.186665
File:
PDF, 221 KB
english, 1994