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SPIE Proceedings [SPIE Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop - Kiev, Ukraine (Thursday 6 May 1993)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Determination of parameters of transitional layers on metals by linear and nonlinear optical methods
Belyi, M. U., Poperenko, Leonid V., Robur, Lubomir I., Shaikevich, Igor A., Svechnikov, Sergei V., Valakh, Mikhail Y.Volume:
2113
Year:
1994
Language:
english
DOI:
10.1117/12.191983
File:
PDF, 1.13 MB
english, 1994