SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] X-Ray and Ultraviolet Spectroscopy and Polarimetry - Modeling and analysis of x-ray emission line images acquired with a prototype model of the XMM Reflection Grating Spectrometer
Paerels, Frits B. S., Bixler, Jay V., den Herder, Jan-Willem, Hailey, Charles J., Kahn, Steven M., Mauche, C. W., Fineschi, SilvanoVolume:
2283
Year:
1994
Language:
english
DOI:
10.1117/12.193207
File:
PDF, 1.08 MB
english, 1994