SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XII - Overcoming shadowing and occlusion in imagery with error-resilient processing
Szu, Harold H., Dai, Liyi, Hsu, Charles, DuBosq, Todd W., Moyer, Steven K., Flug, Eric, Jenkins, Jeffrey, Landa, Joseph S., Byrd, Kenneth, Szu, HaroldVolume:
9118
Year:
2014
Language:
english
DOI:
10.1117/12.2054409
File:
PDF, 560 KB
english, 2014