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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Enhancement of light diffraction efficiency in semiconductors by microwave electric field: experiment and calculations
Subacius, Liudvikas, Gruzinskis, Viktoras, Starikov, Eugenijus, Shiktorov, P., Jarasiunas, Kestutis, Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226168
File:
PDF, 518 KB
english, 1995