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SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Theoretical analysis of the characteristics of a laser-scanned measuring system
Zhang, Guoyu, An, Zhiyong, Zhang, Congzhou, Li, Chengzhi, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253062
File:
PDF, 400 KB
english, 1996