![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Optical System Contamination V, and Stray Light and System Optimization - Temperature effects on reflectance and emittance measurements of Martin Black and Enhanced Martin Black surfaces
Shumway, Andrew L., Shepard, Donald F., Clement, Russel E., McKenna, Paul, Glassford, A. Peter M., Breault, Robert P., Pompea, Stephen M.Volume:
2864
Year:
1996
Language:
english
DOI:
10.1117/12.258330
File:
PDF, 1.02 MB
english, 1996