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SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Machine Vision Applications in Industrial Inspection V - Gradient-based Hough transform for the detection and characterization of defects during nondestructive inspection
Voon, Lew F. L. Y., Bolland, Patrice, Laligant, Olivier, Gorria, Patrick, Gremillet, B., Pillet, L., Rao, A. Ravishankar, Chang, Ning S.Volume:
3029
Year:
1997
Language:
english
DOI:
10.1117/12.271236
File:
PDF, 423 KB
english, 1997