SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Machine Vision Applications in Industrial Inspection V - Binocular peripheral vision system
Maniere, Thierry, Benosman, Ryad, Gastaud, Claude, Devars, Jean, Rao, A. Ravishankar, Chang, Ning S.Volume:
3029
Year:
1997
Language:
english
DOI:
10.1117/12.271247
File:
PDF, 200 KB
english, 1997