SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Effect of matching layer on polarization photosensitivity of an AIIIBV Schottky-barrier photodetector monolithically integrated with an optical waveguide
Dmitruk, Nikolas L., Fursenko, Oksana V., Mayeva, Olga I., Pluta, Maksymilian, Wolinski, Tomasz R.Volume:
3094
Year:
1997
Language:
english
DOI:
10.1117/12.271840
File:
PDF, 415 KB
english, 1997