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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Laser Interferometry VIII: Techniques and Analysis - Two-color laser speckle shift strain measurement system
Tuma, Meg L., Krasowski, Michael J., Oberle, Lawrence G., Greer III, Lawrence C., Spina, Daniel C., Barranger, John P., Kujawinska, Malgorzata, Pryputniewicz, Ryszard J., Takeda, MitsuoVolume:
2860
Year:
1996
Language:
english
DOI:
10.1117/12.276335
File:
PDF, 452 KB
english, 1996