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SPIE Proceedings [SPIE Intelligent Systems & Advanced Manufacturing - Pittsburgh, PA (Tuesday 14 October 1997)] Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III - Integrated scanning sensor system for 3D free-form surfaces
Zhuang, Bao Hua, Lee, Shuo-Jen, Zhang, Wenwei, Harding, Kevin G., Svetkoff, Donald J.Volume:
3204
Year:
1997
DOI:
10.1117/12.294446
File:
PDF, 568 KB
1997