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SPIE Proceedings [SPIE Photonics West '98 Electronic Imaging - San Jose, CA (Saturday 24 January 1998)] Machine Vision Applications in Industrial Inspection VI - Comparison of several artificial neural network classifiers for CT images of hardwood logs
Schmoldt, Daniel L., He, Jing, Abbott, A. Lynn, Rao, A. Ravishankar, Chang, Ning S.Volume:
3306
Year:
1998
Language:
english
DOI:
10.1117/12.301243
File:
PDF, 743 KB
english, 1998