SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Computer-aided mode diagnostics and parameters optimization of a picosecond laser setup based on a modified Sagnak interferometer
Boldovskii, Dmitry N., Tikhonov, Eugene A., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
3359
Year:
1998
Language:
english
DOI:
10.1117/12.306270
File:
PDF, 487 KB
english, 1998