SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Applications of Digital Image Processing XXII - Method for nondestructive testing using multiple-energy CT and statistical pattern classification
Homem, Murillo R. P., Mascarenhas, Nelson D. A., Cruvinel, Paulo E., Tescher, Andrew G.Volume:
3808
Year:
1999
Language:
english
DOI:
10.1117/12.365879
File:
PDF, 1.72 MB
english, 1999