SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Optical Manufacturing and Testing III - Characterization of wavefront variations in coated optics
Oreb, Bozenko F., Netterfield, Roger P., Walsh, Christopher J., Freund, Christopher H., Leistner, Achim J., Seckold, Jeffrey A., Stahl, H. PhilipVolume:
3782
Year:
1999
Language:
english
DOI:
10.1117/12.369189
File:
PDF, 799 KB
english, 1999