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SPIE Proceedings [SPIE International Topical Symposium on Advanced Optical Manufacturing and Testing Technology - Chengdu, China (Wednesday 1 November 2000)] Advanced Optical Manufacturing and Testing Technology 2000 - Measurement of residual stress distribution of xenon flashlamp tube
Zhou, Mu, Chen, Zhe, Hu, Yongming, Meng, Zhou, Ni, Ming, Yang, Li, Pollicove, Harvey M., Xin, Qiming, Wyant, James C.Volume:
4231
Year:
2000
Language:
english
DOI:
10.1117/12.402823
File:
PDF, 194 KB
english, 2000