![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Symposium on Integrated Optics - San Jose, CA (Saturday 20 January 2001)] Testing, Reliability, and Applications of Optoelectronic Devices - Negative luminescence from InAsSbP-based diodes in the 4.0- to 4.3-μm range
Matveev, Boris A., Aydaraliev, Meyrhan, Zotova, Nonna V., Karandashev, Sergey A., Remennyi, Maxim A., Stus', Nikolai M., Talalakin, Georgii N., Malyutenko, Volodymyr K., Malyutenko, Oleg Y., Chin, AlaVolume:
4285
Year:
2001
Language:
english
DOI:
10.1117/12.426876
File:
PDF, 408 KB
english, 2001