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SPIE Proceedings [SPIE International Symposium on Photonics and Applications - Singapore, Singapore (Monday 26 November 2001)] Advanced Photonic Sensors and Applications II - Depth-scanning fringe projection: a new technique for absolute phase evaluation
Windecker, Robert, Koerner, Klaus, Tiziani, Hans J., Asundi, Anand K., Osten, Wolfgang, Varadan, Vijay K.Volume:
4596
Year:
2001
Language:
english
DOI:
10.1117/12.447368
File:
PDF, 335 KB
english, 2001