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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Developments in X-Ray Tomography III - Magnified hard x-ray microtomography: toward tomography with submicron resolution
Schroer, Christian G., Benner, Boris, Guenzler, Til F., Kuhlmann, Marion, Lengeler, Bruno, Rau, Christoph, Weitkamp, Timm, Snigirev, Anatoly A., Snigireva, Irina, Bonse, UlrichVolume:
4503
Year:
2002
Language:
english
DOI:
10.1117/12.452858
File:
PDF, 902 KB
english, 2002