SPIE Proceedings [SPIE SPIE's 27th Annual International...

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SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Advances in Resist Technology and Processing XIX - Novel approach for high resolution using cycloolefin-alt-maleic acid derivatives polymer for ArF lithography

Lee, Jong-Bum, Park, Joo Hyeon, Seo, Dong-Chul, Kim, Chang-Min, Lim, Young T., Cho, Seung-duk, Joo, Hyun-Sang, Jeon, Hyun P., Kim, Seong-Ju, Fedynyshyn, Theodore H.
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Volume:
4690
Year:
2002
Language:
english
DOI:
10.1117/12.474202
File:
PDF, 1.04 MB
english, 2002
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