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SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise as a Tool for Studying Materials - Microstructures of defects causing noise in MOS devices
Fleetwood, Daniel M., Weissman, Michael B., Israeloff, Nathan E., Kogan, A. ShulimVolume:
5112
Year:
2003
Language:
english
DOI:
10.1117/12.487868
File:
PDF, 381 KB
english, 2003