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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Laser Interferometry X: Techniques and Analysis - Mechanical testing using digital speckle photography
Synnergren, Per, Sjoedahl, Mikael, Kujawinska, Malgorzata, Pryputniewicz, Ryszard J., Takeda, MitsuoVolume:
4101
Year:
2000
Language:
english
DOI:
10.1117/12.498442
File:
PDF, 2.20 MB
english, 2000