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SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection - White-light moire phase-measuring interferometry
Stahl, H. Philip, Grover, Chander P.Volume:
1332
Year:
1991
Language:
english
DOI:
10.1117/12.51122
File:
PDF, 505 KB
english, 1991