SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - The noise behavior of silicon JFET transistors from room temperature down to 80K
Arnaboldi, C., Danneville, Francois, Bonani, Fabrizio, Boella, Giuliano, Panzeri, E., Deen, M. Jamal, Levinshtein, Michael E., Pessina, GianluigiVolume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.555775
File:
PDF, 476 KB
english, 2004