SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Atmospheric and Environmental Remote Sensing Data Processing and Utilization: an End-to-End System Perspective - Application of a testbed for validating remote sensor data and retrieval algorithms
Lipton, Alan E., Huang, Hung-Lung A., Bloom, Hal J., Moncet, Jean-Luc, Galantowicz, John, Hu, Haijun, Lynch, Richard, Boukabara, Sid-Ahmed, Hogan, David B., d'Entremont, Robert, He, YuguangVolume:
5548
Year:
2004
Language:
english
DOI:
10.1117/12.559981
File:
PDF, 1.39 MB
english, 2004