SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Fourth Generation X-Ray Sources and Optics II - An accumulative x-ray streak camera with 280-fs resolution
Biedron, Sandra G., Shakya, Mahendra M., Chang, Zenghu, Eberhardt, Wolfgang, Ishikawa, Tetsuya, Tatchyn, Roman O.Volume:
5534
Year:
2004
Language:
english
DOI:
10.1117/12.560526
File:
PDF, 593 KB
english, 2004