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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Nanophotonics, Nanostructure, and Nanometrology - Current detection during tip-induced anodic oxidation of titanium by atomic force microscope
Kuang, Dengfeng, Zhu, Xing, Chou, Stephen Y., Liu, Qinggang, Guo, Weilian, Arakawa, Yasuhiko, Zhang, Shilin, Hu, XiaotangVolume:
5635
Year:
2004
Language:
english
DOI:
10.1117/12.572123
File:
PDF, 215 KB
english, 2004