SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Materials and Devices for Sensing and Imaging II - Influence of a new surface treatment method on ohmic contact resistivity of p-type GaN
Tang, Yingwen, Wang, Anbo, Zhang, Yimo, Li, Xue, Kang, Yong, Ishii, Yukihiro, Li, Xiangyang, Gong, HaimeiVolume:
5633
Year:
2004
Language:
english
DOI:
10.1117/12.572681
File:
PDF, 89 KB
english, 2004