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SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X - Emissive infrared projector sparse grid nonuniformity correction
Joyce, Robert A., Murrer, Jr., Robert Lee, Swierkowski, Leszek, Williams, Owen M.Volume:
5785
Year:
2005
Language:
english
DOI:
10.1117/12.603275
File:
PDF, 430 KB
english, 2005