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SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Optical Pattern Recognition XVI - Optical-electronic technologies in materials analysis

Perju, Veacheslav L., Casasent, David P., Chao, Tien-Hsin, Casasent, David P., Feshchenko, Valeriy S., Feshchenko, Lubov V.
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Volume:
5816
Year:
2005
Language:
english
DOI:
10.1117/12.604321
File:
PDF, 286 KB
english, 2005
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