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SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Raman and photoluminescence characterization of AlGaAs multiple-quantum-well structures formed by focused-ion-beam implantation
Jackson, Howard E., Choo, Ahn G., Weiss, Bernard L., Boyd, Joseph T., Steckl, Andrew J., Chen, Peter, Burnham, Robert D., Smith, Stephen C., Glembocki, Orest J.Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60451
File:
PDF, 195 KB
english, 1992