SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ...

  • Main
  • SPIE Proceedings [SPIE Semiconductors...

SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Raman and photoluminescence characterization of AlGaAs multiple-quantum-well structures formed by focused-ion-beam implantation

Jackson, Howard E., Choo, Ahn G., Weiss, Bernard L., Boyd, Joseph T., Steckl, Andrew J., Chen, Peter, Burnham, Robert D., Smith, Stephen C., Glembocki, Orest J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60451
File:
PDF, 195 KB
english, 1992
Conversion to is in progress
Conversion to is failed