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SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Correlation between electric field, temperature, and carrier concentration with respect to photoreflectance lineshape at the E1 transition of GaAs
Badakhshan, Alireza, Durbin, C., Glosser, Robert, Alavi, Kambiz, Nicholas, S., Dale, D., Capuder, Kenneth, Glembocki, Orest J.Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60456
File:
PDF, 397 KB
english, 1992