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SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Design and Process Integration for Microelectronic Manufacturing IV - A heuristic method for statistical digital circuit sizing
Boyd, Stephen, Wong, Alfred K. K., Singh, Vivek K., Kim, Seung-Jean, Patil, Dinesh, Horowitz, MarkVolume:
6156
Year:
2006
Language:
english
DOI:
10.1117/12.657499
File:
PDF, 568 KB
english, 2006