SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Processing: Machine Vision Applications - Tracking with a new distribution metric in a particle filtering framework
Sandhu, Romeil, Niel, Kurt S., Fofi, David, Georgiou, Tryphon, Tannenbaum, AllenVolume:
6813
Year:
2008
Language:
english
DOI:
10.1117/12.768592
File:
PDF, 641 KB
english, 2008