SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on automatic measurement of tiny-size
Wang, Shijun, Pan, Junhua, Wyant, James C., Mu, Pingan, Dai, Shuguang, Wang, Hexin, Liu, WeiweiVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.783302
File:
PDF, 1009 KB
english, 2007