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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, CA (Sunday 18 January 2009)] Wavelet Applications in Industrial Processing VI - Embedding distortion modeling for non-orthonormal wavelet based watermarking schemes
Bhowmik, Deepayan, Truchetet, Frederic, Laligant, Olivier, Abhayaratne, CharithVolume:
7248
Year:
2009
Language:
english
DOI:
10.1117/12.810719
File:
PDF, 261 KB
english, 2009