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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments - Edge detection based on wavelet analysis
Ha, Yan, Sheng, Yunlong, Wang, Yongtian, Wang, Xiaofei, Zeng, LijiangVolume:
7156
Year:
2008
Language:
english
DOI:
10.1117/12.811780
File:
PDF, 402 KB
english, 2008