SPIE Proceedings [SPIE Fourth International Symposium on Precision Mechanical Measurements - Anhui, China (Monday 25 August 2008)] Fourth International Symposium on Precision Mechanical Measurements - An auto-focusing system for white light microscopic measurement
Chang, Ming, Fei, Yetai, Fan, Kuang-Chao, Deka, Juti Rani, Chen, Pei Jung, Lu, Rongsheng, Chen, Yu Kuan, Cui, ChangcaiVolume:
7130
Year:
2008
Language:
english
DOI:
10.1117/12.819660
File:
PDF, 389 KB
english, 2008