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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Time and Frequency Metrology II - Optical lattice clocks toward 10 -17 uncertainty
Takamoto, M., Ido, Tetsuya, Reid, Derryck T., Akatsuka, T., Hachisu, H., Katori, H.Volume:
7431
Year:
2009
Language:
english
DOI:
10.1117/12.825979
File:
PDF, 935 KB
english, 2009