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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on a new method to measure objects polarization information
Lu, Shaojun, Zhang, Yudong, Sasián, José, Han, Jun, Duan, Cunli, Xiang, Libin, To, Sandy, Guo, Rongli, Zhang, WeiguangVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866614
File:
PDF, 239 KB
english, 2010