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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems - Application of chaos optimization algorithm in the micro spectrometer
Xiong, Yu Hong, Ye, Tianchun, Han, Sen, Xu, Shao Ping, Lv, Xiao Lan, Kameyama, Masaomi, Hu, Song, Jiang, Shun Liang, Ye, Fa Mao, Zhou, Shi LinVolume:
7657
Year:
2010
Language:
english
DOI:
10.1117/12.867597
File:
PDF, 272 KB
english, 2010