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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Infrared, Millimeter Wave, and Terahertz Technologies - Research on thermal characteristics of electronic devices using thermal microscopes
Gao, Lu, Zhang, Cunlin, Zhang, Xi-Cheng, Wang, Jihui, Jin, Weiqi, Siegel, Peter H., He, Li, He, Xingdao, Shi, Sheng-CaiVolume:
7854
Year:
2010
Language:
english
DOI:
10.1117/12.869621
File:
PDF, 5.81 MB
english, 2010