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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco Airport, California, USA (Sunday 23 January 2011)] Document Recognition and Retrieval XVIII - Natural scene logo recognition by joint boosting feature selection in salient regions

Fan, Wei, Agam, Gady, Viard-Gaudin, Christian, Sun, Jun, Naoi, Satoshi, Minagawa, Akihiro, Hotta, Yoshinobu
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Volume:
7874
Year:
2011
Language:
english
DOI:
10.1117/12.873341
File:
PDF, 1.84 MB
english, 2011
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